The surface morphology, crystal structure, functional groups, elemental composition, and optical properties of the Si-CQDs were characterized using TEM (HRTEM), XRD, FT-IR, XPS, UV-vis absorption and fluorescence spectroscopy.
Using 30keV, which is lower than that for conventional TEM (100-300keV), together with low detection angles (15-55mrad) enhances the signals from the fibrils.
The structure, morphology, and optical properties of the as-prepared WS<sub>2</sub>/Bi<sub>2</sub>MoO<sub>6</sub> samples were characterized by XRD, XPS, SEM, TEM (HRTEM), and UV-vis diffuse reflectance spectra (DRS).